Thin Film Near Field Absorbers in Specific EMI Environments
Speakers: Jeff Tostenrude, 3M Company Chapter: IEEE German EMC Chapter Abstract: In this work we utilize different electromagnetic interference (EMI) environments to test near field absorber performance as well as absorber placement. We use in-house designed test fixtures to mimic some of the real-world EMI environments: shield cans and metal shielding screens. The near field …