Thin Film Near Field Absorbers in Specific EMI Environments
May 19 @ 10:00 am - 11:00 am EDT
Speakers:
Jeff Tostenrude, 3M Company
Chapter:
IEEE German EMC Chapter
Abstract:
In this work we utilize different electromagnetic interference (EMI) environments to test near field absorber performance as well as absorber placement. We use in-house designed test fixtures to mimic some of the real-world EMI environments: shield cans and metal shielding screens. The near field test results are compared to the reflection loss, one of the most used absorber metrics.