YP Ambassador
Yibo Wang
Young Professional Ambassador
Yibo Wang
Term 2026-2027
ETS-Lindgren
Cedar Park, TX
Yibo Wang received his Ph.D. in electromagnetics from the University of Houston, an M.S. in electrical and computer engineering from The Ohio State University, and a B.S. from Wuhan University. He is currently a Principal RF Engineer with ETS-Lindgren in Cedar Park, Texas. His work focuses on chamber design and modeling, absorber modeling, and RF testing. His research interests include antenna measurement techniques, echo-reduction techniques for test environments, EMC measurements, and dielectric measurement techniques. He serves on the IEEE EMC Society Technical Program Committee and Antenna Measurement Techniques Association (AMTA) Technical Coordinating Committee. He is also a working group member of the IEEE 1128 (absorber evaluation) and IEEE 1309 (probe calibration) standards working groups. He has been an invited speaker for the IEEE EMC Society Boston Chapter (2022) and the AMTA 2025 regional event, and he is the chair “Range Design, Instrumentation, and Characterization” session at AMTA 2025. Dr. Wang co-authored papers that received Best Paper Awards at AMTA 2022 and 2023.
Talk: Time-Domain Gating Software with Enhanced Band-Edge Treatment and Its Application to EMC Chamber Debugging
Abstract:
Time-domain gating is a well-known technique for isolating responses and is commonly integrated into commercial vector network analyzers (VNAs) as a black-box feature. This presentation first provides an under-the-hood view of the time-domain gating algorithm. After measurement data is exported from a VNA, users often have limited options for further post-processing. To address this limitation, we developed a time-domain gating library for post-processing VNA data in common programming environments. A key challenge in time-domain gating is the band-edge effect caused by limited measurement bandwidth. The library includes standard edge-treatment techniques and introduces Spectrum Extension Edgeless Gating (SEEG), which significantly reduces edge artifacts. This presentation compares results from conventional edge renormalization techniques and SEEG to highlight the latter’s improved edge treatment. Finally, we demonstrate the use of time-domain gating to troubleshoot an EMC chamber above 1 GHz in accordance with ANSI C63.25.1.