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EMC Webinar Series 2022: Getting to the Source – Integrated Circuits (ICS) and Component EMC Testing
February 23, 2022 @ 10:00 am - 11:00 am EST
Free
Failures in EMC testing often result in treating the symptoms of the issue rather than attacking the source. If we know the source of the issue rather than chase the symptoms, we will save time, cost, and frustrations. In this discussion, we will attack EMC testing from a component standpoint so that when issues arise, we can pinpoint the solution, saving time, cost, and frustrations.
Speaker: Dean Landers, Current chair of the Philadelphia IEEE EMC Chapter, Supervisor of Application Engineers, AR RF/Microwave Instrumentation
Chapter: Philadelphia