Joint EMC Technical Event
Presentations & Speakers:
Why Should I be a Member of the IEEE Society?
Dr.-Ing. Mathias Magdowski, Scientific Coworker, Otto von Guericke University Mageburg
From Idea to Prototype: High-Speed Robotic Near-Field Scans
Dr. Cheng Yang, Chief Engineer, TU Hamburg
NATO AECTP500 in Comparison to MIL-STD-461H
Mr. Juergen Kausche, Product Manager, R&S
Reverberation Chambers to Radiated Emission Measurements: Fundamentals, Applications and Insights from Stochastic Wave Coupling to Transmission Lines
Mrs. Satanika Lowe, PhD Researcher, Otto von Guericke University Magdeburg
Technical Tour of EMC Lab with Emission Testing Demo
Mr. Jens Medler, Product Manager for EMI Test Receivers, Rohde & Schwarz
Mr. Tobias Groß, Product Manager for EMI Test Receivers, Rohde & Schwarz
Chapter:
IEEE EMC German Chapter
Abstract:
In collaboration with IEEE and EMC Society (German Chapter)
Join us for a technical event featuring EMC talks by IEEE Senior Member Dr. Cheng Yang, Rohde & Schwarz and OVGU.
On-site delegates can network with industry colleagues during the social event and join a technical tour with an Emission testing demo in the EMC test lab at Rohde & Schwarz.
Date: July 2, 2026
Time: 13:00 to 18:00 CEST
Please register before June 15, 2026, for this event and choose your form of participation. Seats on site are limited.
We are looking forward to meeting you in Munich.