2007 IEEE International Symposium on EMC Sets Records!

The 2007 IEEE International Symposium on EMC set an all time record in the number of papers received for the Symposium’s technical program. The ten Technical Committees (TCs) of the IEEE EMC Society reviewed over 300 papers! TC-2, which addresses “EMC Measurement”, received the largest number of papers, followed by TC-4 on “EMI Control” and TC-9 on “Computational EMC”. The best papers will be presented during the Symposium, which takes place at the Hawaii Convention Center in Honolulu, Hawaii over July 8-13, 2007.
Todd Hubing of Clemson University and Don Heirman of Don HEIRMAN Consultants are the Co-Chairs of the Symposium’s Technical Program. Professor Hubing noted, “We were especially gratified to not only receive a high number of papers, but also papers from authors around the world. Approximately 30% of the paper authors are from Asia, 31% are from the US and 39% are from Europe. This represents a truly international program of papers for the symposium this year.” Added Mr. Heirman, “We were also pleased to see excellent special sessions and workshops submitted on such important topics as Automotive EMC, Signal Integrity, EMC and Wireless Devices, and Managing Regulatory Access to Asia Pacific Markets, to name just a few.”
The year 2007 marks the 50th Anniversary of the EMC Society. Janet O’Neil of ETS-Lindgren, Chair of the Symposium Steering Committee, announced many special activities are planned to commemorate this milestone. “The Hawaii Convention Center was selected as the venue for this special symposium as its geographic location will appeal to EMC engineers in Asia, which is the fastest growing region for IEEE EMC Society membership. In addition, we’re celebrating the 50th anniversary in the 50th state, a unique tie-in that we’ll see just once in our lifetimes. We welcome those interested in EMC to join us in Hawaii to hear excellent technical papers, view a comprehensive technical exhibition, and celebrate our 50th anniversary with us.”
The IEEE EMC Society addresses engineering related to the electromagnetic environmental effects of systems to be compatible with itself and their intended operating environment. This includes standards, measurement techniques and test procedures, instrumentation, equipment and systems characteristics, interference control techniques and components, education, computational analysis, and spectrum management, along with scientific, technical, industrial, professional or other activities that contribute to this field. Each year, over 2,000 people interested in electromagnetic compatibility meet at the Society’s annual Symposium, the premier event known worldwide for the high quality and quantity of technical papers on EMC. The corresponding exhibition attracts leading companies that occupy more than 100,000 sq. ft. of convention center space. For more information, visit EMC

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