EMC PERSONALITY PROFILE

The EMC Society has many distinguished members that deserve to be featured in the EMC Personality Profile column. For example, our Fellows deserve recognition. The IEEE Fellow status is granted to members with an extraordinary record of accomplishments in one of the IEEE designated fields of interest. The IEEE Board of Directors confers the honor.
In 2005, the EMC Society had four members (Dr. Bruce Archambeault, Professor Heyno Garbe, Dr. Todd Hubing, and John Osburn) elected to the Fellow Grade. These four new Fellows are featured in the EMC Personality Profile in this issue of the EMC Newsletter.

Dr. Bruce Archambeault
Dr. Archambeault was elected to the Fellow grade “for leadership in and application of numerical modeling for product EMI compliance and understanding of EMI coupling paths.” Bruce received a Bachelors degree from the University of New Hampshire, a master’s degree from Northeastern University and a doctor’s degree from the University of New Hampshire. Bruce worked for Digital Equipment Corporation in the 1990 time frame and he began looking for a way to apply computational electromagnetic (EM) modeling to provide an understanding of EMI coupling and radiation mechanisms. The goal was to achieve EMI compliance without so many retrofits and re-designs of a product. At that time, the complexity of a printed circuit design and its enclosure went well beyond the available computational resources. This remains true today. The challenge in computational EMI modeling is to reduce the complexity of the design to those features that affect the radiation and the EMI coupling paths. Dr. Archambeault made two significant contributions. First, through research, he developed a basic understanding of EMI coupling paths. Second, he used this basic understanding to reduce the complexity of circuits and their enclosures so computational EM modeling could be applied. Bruce has used the results of his efforts to develop a systematic approach to EMI compliance. He taught this approach throughout IBM (his present employer), and as a result, compliance has been achieved with minimum retrofits on the first design validation prototype. Bruce has distributed his computational design process throughout the EMC design community through workshops, tutorials, books, conference papers and short courses. He is active in the IEEE EMC Society and has received a number of awards for his work.

Professor Heyno Garbe
Professor Garbe was elected to the Fellow grade “for contributions to the analysis and standardization of EMC measurement techniques with TEM waveguides.” Heyno received bachelor, master and PhD degrees from the University of the Federal Armed Forces in Hamburg, Germany. Professor Garbe is a technical leader and innovator in the development of TEM waveguide test methodology that provides low cost, repeatable EMC susceptibility testing as compared to more expensive open area test site, shielded room or anechoic chamber facilities. Professor Garbe’s efforts focused on:

 

 

 

 

  • The development of analytic models for TEM waveguides;
  • The characterization of loaded TEM waveguides;
  • The advancement of statistical methods to insure homogeneity of electric field strength for repeatable measurements;
  • The deployment of depolarization angle criteria for determining the presence of a TEM mode; and
  • Leading the Joint Task Force CISPRA/A and TC77 on TEM waveguides that was responsible for the recently published IEC 61000-4-20.

Professor Garbe is a renowned engineering educator. In 1998, he was appointed Dean for Education in the Department of Electrical Engineering and Information Technology at the University of Hanover, Germany. Heyno has been very active in the EMC Society. He was instrumental in the formation of the German EMC Chapter in 1994. Since 1997 he has served as the Chapter Chairman. As a result of his efforts to improve Chapter activities, the German Chapter received the EMC Society Chapter of the Year Award in 2001. In addition to his chapter activities, he has acted as an Associate Editor of the IEEE Transactions on EMC. In 2003, the EMC Society honored Dr. Garbe by presenting the Laurence G. Cumming Award for Outstanding Service and Leadership to him.

Dr. Todd Hubing
Dr. Hubing was elected to the Fellow grade “for contributions to numerical electromagnetic modeling of printed circuit boards and enhancing the understanding of EMC and electromagnetic phenomena.” Todd received a BEE degree from the Massachusetts Institute of Technology, a MEE from Purdue University and a PhD (EE) from North Carolina University. Dr. Hubing is recognized as a leading authority in the advancement and novel application of computational electromagnetics (CEM) for solving real world EMC problems. He began his career more than 20 years ago when he joined the Radiation Engineering Laboratory at IBM in Research Triangle Park. At IBM, he contributed to the development of dozens of new products including networking equipment, communications products, and some of the earlier personal computers. His primary responsibility was making sure that these products met EMC requirements. As a graduate student at North Carolina State University, he developed an interest in CEM modeling and was one of the first to apply a full wave numerical modeling technique to predict an EMI problem with an actual product under development. In 1989, Todd left IBM to join the University of Missouri – Rolla (UMR) where he was a leader in establishing the UMR EMC laboratory. The lab became a valuable source for information on CEM. Currently, Todd is responsible for several important technological developments that have had a significant impact on EMC. These include the development of:

  • Novel mathematical/computer models for efficiently locating EMI problems in printed circuit board designs and estimating their impact on radiated EMI tests;
  • New techniques for modeling and analysis of embedded capacitance; and
  • Development of the voltage-driven/current-driven concept for characterizing sources of common-mode currents.

Todd has been an active supporter of the EMC Society. He has co-authored 37 journal publications and more than 100 conference papers. Todd was President of the EMC Society in 2002 and 2003.

John Osburn
John Osburn was elected to the Fellow Grade “for contribution to education of the Electromagnetic Environmental Effects (E3) community and pioneering the development of new EMC test technology.” John received a Bachelors Degree from the University of Texas at Austin and a Masters Degree from the University of Southern California. He has worked in the EMI/EMC technology area, primarily as a technical team leader responsible for defining the requirements and establishing procedures for resolving a myriad of real world EMI problems. He has developed several EMI/EMC courses. He was the lead instructor of a TEMPEST design course and he developed the TEMPEST facilities design course, for which he received a letter of commendation from the National Security Agency (NSA) in 1986. He has directed almost 100 MIL-STD-461/2 and TEMPEST tests and more than 300 commercial EMC tests. In the early 1990s, John helped pioneer the development of new techniques (facilities and instrumentation) to perform accurate electromagnetic shielding measurements. He was the technical lead of the development team at EMCO responsible for the original production of the Gigahertz Transverse Electromagnetic (GTEM) chamber, which is considered to be one of the industry standards in EM measurement facilities. During the 1980s, John led engineering teams that used one of the first EMC analysis computer programs for analyzing large complex systems. This included the Intrasystem Electromagnetic Compatibility Analysis Program (IEMCAP). John has been active in the EMC Society as Chairman of the 1997 IEEE International Symposium on EMC. He also served as Vice Chairman of the Central Texas Chapter and Chairman of the Denver Chapter of the EMC Society. EMC


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